Master ESD protection skills to improve the reliability of electronic products
Release time:2024-08-30
In the destruction of ESD, static electricity can cause devastating damage to I/O ports, which may cause data bit ghosting, product damage, and even "hard failure" of electronic equipment or component damage. Therefore, engineers need to consider the ESD problem in the design and master the solution.
At present, more and more low power logic chips are used in portable products. Due to the limitation of metal oxide semiconductor (MOS) dielectric breakdown and bipolar reverse junction current, these logic chips are very sensitive to ESD. IC chips that control I/O ports (USB ports, Ethernet ports, etc.) are no exception because most of them are designed and manufactured based on CMOS processes, which makes IC chips very sensitive to damage caused by ESD. In addition, most I/O ports (especially USB ports) are hot-swappable systems, which are highly susceptible to ESD caused by users or air discharge. Thus, ESD protection is essential in today's portable and USB applications.
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